Product

Airborne Molecular contamination (AMC) control

Adixen Pod Analyser In-line FOUP monitoring (APA 302)

Solution to global defects reduction in 200 / 300 mm I.C.Fabs by monitoring environments

The APA 302 (Adixen Pod Analyzer) is a unique in-line FOUP AMC monitoring solution to:

  • Detect in 2 mn and characterize at FOUP and wafer level
  • Improve understanding of the wafer environment
  • Provide real time data to optimize cleaning techniques

BENEFITS

  • Real time monitoring
  • High Sensitivity (sub ppbv detection)
  • No FOUP modification Needed
  • High Throughput


    For more information, please contact Emmanuelle VERAN: emmanuelle.veran@adixen.fr
Adixen Pod Analyser In-line FOUP monitoring (APA 302)

Documentation :

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